QUALITY ASSURANCE SOLUTIONS
MSR-FSR provides third-party Certification Testing and Analysis for our client’s Critical Project needs. We are experienced in providing Certification Testing and Analysis Services for our client’s Critical Process Piping systems. MSR-FSR Certification Testing and Analysis programs ensure the performance of Ultra-High Purity critical process systems.
MSR-FSR provides Certification and Analytical Solutions to IDM’s, A&E Firms, and Critical System Installers Worldwide. We have developed a customized Certification Testing and Analysis program that integrate our extensive field experience and our credible reporting systems to ensure the performance of our client’s UHP critical process systems. Our employees are seasoned veterans with excellent communication skills that integrate seamlessly into our client’s project team to ensure a successful project.
BETTER PEOPLE PROCESSES… MSR-FSR
CERTIFICATION TESTING
- Pressure Decay Testing
- Helium Leak Testing
- Particulate Analysis
- Moisture Analysis
- Oxygen Analysis
- Chemical Analysis
- TOC/Resistivity
TESTING EQUIPMENT
- Trace Moisture Analyzers
- Delta F Oxygen Analyzers
- MetOne 3411 LPC’s
- Laco TitanTest HLD’s
- Sievers M9 TOC UPW Analyzers
THIRD-PARTY CERTIFICATION TESTING & ANALYTICAL TESTING
MSR-FSR utilizes unique reporting software that integrates our extensive field experience and real-time project data. The FSR Education Program sets our company apart from competitors, as we value the continuing education of our employees which translates into a better service offering.
Semiconductor Testing
- Leak Detection
- Particle Analysis
- Trace Gas Testing
- Ultra-Pure Water Testing
- Hydrocarbon Testing
- Material Source/Receipt Inspection
- Non-Destructive Examination (NDE), Non-destructive testing (NDT)
Pharmaceutical and Life Science Testing
- Slope Verification
- Welder Certification
- Digital Borescope Weld Inspection
- Material Receipt Inspection
- Source Inspection
- NDE/NDT Level II and CWI Weld Inspections
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Frequently Asked Questions
What is the cleaning process of semiconductors?
The cleaning process of semiconductors involves several steps to remove contaminants like dust, organic residues, and metallic particles, which are crucial for the performance and reliability of semiconductor devices. Key steps include:
- Solvent Cleaning: Removes organic contaminants using chemicals like acetone and isopropyl alcohol.
- Acid and Base Cleaning: Utilizes solutions like the RCA clean method to eliminate ionic contaminants and particles.
- Rinsing and Drying: Involves thorough rinsing with deionized water followed by drying to remove any leftover chemicals.
- Megasonic/Ultrasonic Cleaning: Applies high-frequency sound waves to dislodge particles from the wafer surface.
- Advanced Techniques: Additional methods like plasma, ozone, or UV cleaning may be employed for specific needs.
What does quantum clean do?
"Quantum clean" in the context of semiconductor manufacturing refers to an exceptionally high level of cleanliness achieved through advanced cleaning processes that target not only visible contaminants but also atomic and molecular-level impurities. This level of cleanliness is crucial for advanced semiconductor processes, especially as devices shrink to the nanometer scale, where even the smallest contaminants can have a significant impact on device performance and yield.
The quantum cleaning process involves techniques that can remove even the most minute contaminants, including:
- Advanced Chemical Cleaning: This might involve sophisticated versions of the RCA clean process or other chemical treatments designed to remove specific types of contaminants at the atomic level.
- Plasma Cleaning: Utilizing plasma, a highly ionized gas, to remove contaminants from the wafer surface. Plasma cleaning can be effective in removing organic residues, particles, and other types of contamination without the need for direct contact or chemicals that might leave a residue.
- Ultraviolet (UV) Ozone Cleaning: This method uses UV light in the presence of ozone to generate highly reactive oxygen species that can effectively remove organic contaminants by oxidizing them.
- High-Temperature Annealing: Heating the semiconductor wafers to high temperatures under controlled conditions can drive off contaminants and repair damage to the crystal structure.
- Atomic Layer Etching (ALE): This is a precision etching process that removes atomic layers from the semiconductor surface, which can be used to eliminate contaminants or unwanted material with extreme precision.
What are the components of semiconductor equipment?
Semiconductor equipment is quite diverse and complex, as it comprises various machines used in different steps of semiconductor manufacturing. The components of semiconductor equipment vary significantly depending on their specific use, such as photolithography, deposition, etching, ion implantation, cleaning, and inspection. However, we can categorize the components into a few general groups for a broad understanding:
- Chamber Components: These are parts of the equipment where the actual semiconductor processing occurs. They can be vacuum chambers, reaction chambers, etching chambers, deposition chambers, etc. Each chamber is designed to create specific conditions necessary for a particular manufacturing step.
- Wafer Handling Systems: These systems are responsible for transporting semiconductor wafers through the equipment during the manufacturing process. They include robotic arms, end effectors, aligners, and wafer loaders/unloaders, ensuring minimal contact with the wafers to avoid contamination.
- Control Systems: These are sophisticated computer systems that manage the equipment's operation. They control process parameters like temperature, pressure, gas flow, and timing, ensuring that the manufacturing processes are executed precisely and consistently.
- Power Supplies and Distribution Systems: Semiconductor equipment often requires precise and variable power supplies, especially for processes like plasma generation, heating elements, and motors. These systems must provide stable and controllable power to various components of the equipment.
- Gas Delivery Systems: Many semiconductor processes, like deposition and etching, require precise delivery of gases. These systems include gas cylinders, mass flow controllers, valves, and piping, all designed to deliver specific gases in controlled amounts to the process chambers.
- Vacuum Systems: Vacuum systems are critical for processes that need to be carried out in a controlled atmosphere or vacuum. These include vacuum pumps, vacuum chambers, valves, and gauges, enabling the creation and maintenance of the required vacuum levels.
- Cooling and Heating Systems: Temperature control is crucial in semiconductor processes. Equipment components include heaters, chillers, heat exchangers, and cooling plates, ensuring that the process temperatures are maintained within the required ranges.
- Sensors and Monitoring Equipment: These components include various sensors and detectors that monitor process conditions such as temperature, pressure, gas concentrations, and plasma conditions, providing feedback to the control systems to adjust the process parameters as needed.
- Cleaning and Maintenance Tools: These are tools and systems designed for the cleaning and maintenance of semiconductor equipment, ensuring that the components are free from contaminants and are operating correctly.
What is wafer cleaning process?
The wafer cleaning process in semiconductor manufacturing is crucial for removing contaminants from silicon wafers before and during the various stages of chip fabrication. Even minute particles or impurities can significantly impact the performance and yield of semiconductor devices. The wafer cleaning process involves several steps, often tailored to the specific contaminants and the subsequent processes the wafer will undergo. Here's an overview of the typical wafer cleaning process:
- Solvent Cleaning: This initial step aims to remove organic contaminants such as grease, oils, and photoresist residues from the wafer surface. Solvents like acetone, isopropyl alcohol, or methanol are commonly used. Wafers are immersed in these solvents and may be subjected to ultrasonic agitation to enhance contaminant removal.
- Aqueous Cleaning: After solvent cleaning, wafers are typically cleaned with deionized (DI) water to remove particulate matter and ionic contaminants. This step may involve multiple rinses or the use of megasonic cleaning, which uses high-frequency sound waves to dislodge particles from the wafer surface.
- Chemical Cleaning: This involves the use of specific chemical solutions to target different types of contaminants:
- RCA Clean: A standard procedure that includes two main steps:
- SC-1 (Standard Clean 1): A mixture of ammonium hydroxide (NH₄OH), hydrogen peroxide (H₂O₂), and water is used to remove organic residues and particles.
- SC-2 (Standard Clean 2): A mixture of hydrochloric acid (HCl), hydrogen peroxide (H₂O₂), and water targets metallic contaminants and some ionic impurities.
- HF Dip: Hydrofluoric acid (HF) is used to remove native silicon dioxide from the wafer surface, which can trap contaminants and impede further processing steps.
- RCA Clean: A standard procedure that includes two main steps:
- Rinse and Dry: Following chemical cleaning, wafers are thoroughly rinsed with DI water to remove any residual chemicals. They are then dried using methods like spin drying or nitrogen blow drying, which prevent water spots and ensure that no contaminants are reintroduced.
- Advanced Cleaning Techniques: For certain applications, especially in advanced semiconductor nodes, additional cleaning steps may be employed, such as plasma cleaning, UV-ozone cleaning, or megasonic cleaning, to achieve the required level of cleanliness at the atomic level.
what is SPC Tracking?
SPC (Statistical Process Control) tracking is a method used in manufacturing, including semiconductor manufacturing, to monitor, control, and optimize processes through statistical methods. It is a core component of quality control that helps ensure manufacturing processes produce products within the desired specifications consistently. Here's a breakdown of what SPC tracking involves:
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- Data Collection: The first step in SPC tracking is the systematic collection of data from the manufacturing process. This data typically includes measurements of product characteristics, process parameters, or other key quality indicators. For instance, in semiconductor manufacturing, this could involve measurements of layer thickness, line widths, or electrical properties.
- Statistical Analysis: The collected data is analyzed using statistical methods to identify patterns, trends, and variations. This analysis often involves calculating mean values, variances, and other statistical parameters to understand the process behavior over time.
- Control Charts: A fundamental tool in SPC tracking is the control chart, which is used to plot data points over time, comparing them against predetermined control limits (upper and lower) and a central line (average). These charts help in visualizing the stability of the process and identifying any signs of unusual variations that could indicate potential problems.
- Process Monitoring: Continuous monitoring of the process through SPC helps identify when the process is deviating from its intended operating conditions. By detecting these changes early, it's possible to intervene before defects occur or the process produces outputs outside the acceptable range.
- Identifying Variations: SPC tracking helps distinguish between common cause variation (natural variation inherent in the process) and special cause variation (due to specific, identifiable sources). Understanding these variations is crucial for effective process control and improvement.
- Improvement Actions: When SPC tracking identifies a process that is not under control or could be improved, corrective actions are taken to address the underlying causes of variation. This might involve adjusting the process, performing equipment maintenance, or changing materials.
- Continuous Improvement: SPC tracking is an ongoing process that contributes to continuous improvement in manufacturing. By regularly analyzing process data, manufacturers can make informed decisions to enhance quality, reduce waste, increase efficiency, and meet customer satisfaction.
What is cleaning sequence?
The cleaning sequence in semiconductor manufacturing refers to the ordered series of steps undertaken to remove contaminants from the surface of semiconductor wafers. This sequence is crucial for ensuring the wafers are free from particles, organic residues, and metallic impurities, which could otherwise lead to defects in the semiconductor devices. While specific cleaning sequences can vary depending on the exact manufacturing requirements, a general cleaning sequence typically includes the following steps:
- Pre-cleaning: This step might involve rinsing the wafers with deionized water to remove loose particles and surface contaminants. It serves as a preliminary step before more intensive cleaning processes.
- Solvent Cleaning: This involves using organic solvents such as acetone, isopropyl alcohol (IPA), or methanol to remove organic contaminants from the wafer surface. Wafers may be immersed in these solvents and possibly subjected to ultrasonic agitation to enhance cleaning effectiveness.
- Aqueous Cleaning: After solvent cleaning, the wafers are often cleaned with deionized water or aqueous solutions to remove residual particles and ionic contaminants. This step may include the use of megasonic or ultrasonic cleaning to further dislodge particles.
- Chemical Cleaning: This is a critical phase where specific chemical solutions are used to target various types of contaminants:
- RCA Clean: The RCA cleaning process, developed by the Radio Corporation of America, is widely used in the semiconductor industry. It usually involves two main sub-steps:
- SC-1 (Standard Clean 1): A mixture of ammonia (NH₄OH), hydrogen peroxide (H₂O₂), and water is used at elevated temperatures to remove organic residues and particles.
- SC-2 (Standard Clean 2): This involves a mixture of hydrochloric acid (HCl), hydrogen peroxide (H₂O₂), and water to remove metallic contaminants and some ionic impurities.
- RCA Clean: The RCA cleaning process, developed by the Radio Corporation of America, is widely used in the semiconductor industry. It usually involves two main sub-steps:
- Rinse and Dry: After the chemical treatments, the wafers are thoroughly rinsed with deionized water to remove any remaining chemicals. Finally, the wafers are dried using methods such as spin drying or nitrogen blow drying to prevent water spots and recontamination.
- Advanced Cleaning Steps: Depending on the process requirements, additional cleaning steps like HF (hydrofluoric acid) dips to remove native oxides or specialized treatments like ozone or plasma cleaning may be included to ensure the wafer surface is prepared for subsequent processing steps.